CRYOSCAN 2200
multifunctional scanning probe microscope
New
possibilities for the study of surface morphology and local properties with
subnanometer space resolution
Scanning probe microscopy in the 1,8 К- 350 K temperature range
- atomic force microscopy
- scanning tunneling microscopy
- scanning
resistance microscopy
- electrostatic microscopy
- magnetic force
microscopy
- nano lithography
- remote control via Internet
Technical parameters
| Cryogenic system |
| Temperature interval , K |
1,8 - 350 |
| Sample space diameter , mm |
40 |
| Helium reservoir , l |
2,2 or 4,2 |
| Nitrogen reservoir , l |
2,5 or 3,5 |
| Temperature stability in the interval 4 - 40, K* |
±0,04 |
| Temperature stability in the interval 40 - 300, K |
±0,2 |
| Cooling down time (to 4,2 K), min |
30 |
| Helium consumption for 4.2 K cooling down , l |
1,4 |
| Sample change time , min |
5 |
| Helium consumption at 4,2 K, l/hour |
<0,1 |
| Operation time at 1.8 К |
About 6 hours |
| Cryostat dimensions |
Diameter 200 mm, 750 mm height |
| Weight , kg |
12 |
Probe microscopy
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System for precise scanning: Scanner FSS-3:
scanning
range ? up to 3 ?
step discrete ? 0,01 nm
scanning rate max. ? 30
Hz
typical thermal drift ? less than 0,1 nm/sec
Scanner FSS-15:
scanning range ? up to 15 ?
step discrete ? 0,03 nm
scanning
rate max. ? 30 Hz
typical thermal drift ? less than 1 nm/sec
sample
orientation ? horizontal
sample size ? up to 10 mm in diameter and 5 mm in
height
probe -sample approach ? truly vertical (no lateral shift)
initial
probe-sample approach - 4 mm by step motor
probe vertical displacement
discrete during initial approach ? 30 nm
Scanning tunneling
microscopy mechanical head
STM modes: constant height, constant
mode, spectroscopy, nanolithography
I(U) and I(Z) dependencies in selected
regions
Resolution ? atomic on graphite
Tunneling current ? 50 pA-50
nA
Bias voltage range ? ±10 V
Atomic force microscopy
head
AFM modes: constant force, constant current,
friction
Resolution ? atomic on mica
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Measurements in resonant modes Nanolithography
Magnetic force
microscopy mechanical head
Interleave and lift modes for contact and
resonance modes
Force sensitivity ? up to 10-11 N
Single magnetic domains
space resolution
Cantilevers with different magnetic coatings
Simultaneous
acquisition of topography and magnetic profile data
Electronic
control unit
12 DAC (16 bit, 10 ?sec), 2 8-channels ADC (16 bit, 10
?sec). DSP digital feedback. Embedded direct frequency synthesizer (0,01 Hz ? 10
MHz)
Software
Microscope control software (master
software) and data analysis software (client software) for Windows XP.
Master
software ? local or remote control (network, Internet).
Client software ?
local or remote real-time data acquisition, variety of filters, mathematical
functions and algorithms for data analysis and 3D imaging.
Single Master and
Multiple Clients operation. Embedded chat of intercommunication.
Detailed
software description is placed at www.nanoscopy.net.
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