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System for precise scanning
Scanner FSS-3:
Scanning range – up to 3 μ.
Step discrete – 0.01 nm.
Scanning rate max. – 30 Hz.
Typical thermal drift – less than 0.1 nm/sec.
Scanner FSS-15:
Scanning range – up to 15 μ.
Step discrete – 0.03 nm.
Scanning rate max. – 30 Hz.
Typical thermal drift – less than 1 nm/sec.
Sample orientation – horizontal.
Sample size – up to 10 mm in diameter and 5 mm in height.
Probe-sample approach – truly vertical (no lateral shift).
Initial probe-sample approach – 4 mm by step motor.
Probe vertical displacement discrete during initial approach – 30
nm.
Scanning tunneling microscopy mechanical head
STM modes: constant height, constant mode, spectroscopy,
nanolithography.
I(U) and I(Z) dependencies in selected regions.
Resolution atomic on graphite.
Tunneling current – 50 pA - 50 nA.
Bias voltage range ±10 V.
Atomic
force microscopy head
AFM modes: constant force, constant current, friction.
Resolution atomic on mica.
Measurements in resonant modes.
Nanolithography.
Magnetic force microscopy mechanical head
Interleave and lift modes for contact and resonance modes.
Force sensitivity – up to 10-11 N.
Single magnetic domains space resolution.
Cantilevers with different magnetic coatings.
Simultaneous acquisition of topography and magnetic profile
data.
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Electronic control unit
12
DAC (16 bit, 10 sec), 2 - 8 channels ADC (16 bit, 10 sec). DSP digital feedback.
Embedded direct frequency synthesizer (0.01 Hz - 10 MHz).
Software
Microscope control software (master software) and data analysis software
(client software) for Windows XP.
Master software – local or remote control (network, Internet).
Client software – local or remote real-time data acquisition, variety of
filters, mathematical functions and algorithms for data analysis and 3D
imaging.
Single Master and Multiple Clients operation. Embedded chat of
intercommunication.
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